Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient Faults - researchr publication authors

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Shuo Cai, Binyong He, Weizheng Wang, Peng Liu 0045, Fei Yu 0009, Lairong Yin, Bo Li 0051. Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient Faults. J. Electronic Testing, 36(4):469-483, 2020. [doi]

This author has not been identified. Look up 'Shuo Cai' in GoogleThis author has not been identified. Look up 'Binyong He' in GoogleThis author has not been identified. Look up 'Weizheng Wang' in GoogleThis author has not been identified. Look up 'Peng Liu 0045' in GoogleThis author has not been identified. Look up 'Fei Yu 0009' in GoogleThis author has not been identified. Look up 'Lairong Yin' in GoogleThis author has not been identified. Look up 'Bo Li 0051' in Google

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