Shuo Cai, Binyong He, Weizheng Wang, Peng Liu 0045, Fei Yu 0009, Lairong Yin, Bo Li 0051. Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient Faults. J. Electronic Testing, 36(4):469-483, 2020. [doi]
@article{CaiHWLYYL20,
title = {Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient Faults},
author = {Shuo Cai and Binyong He and Weizheng Wang and Peng Liu 0045 and Fei Yu 0009 and Lairong Yin and Bo Li 0051},
year = {2020},
doi = {10.1007/s10836-020-05898-x},
url = {https://doi.org/10.1007/s10836-020-05898-x},
researchr = {https://researchr.org/publication/CaiHWLYYL20},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {36},
number = {4},
pages = {469-483},
}