Shuo Cai, Binyong He, Weizheng Wang, Peng Liu 0045, Fei Yu 0009, Lairong Yin, Bo Li 0051. Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient Faults. J. Electronic Testing, 36(4):469-483, 2020. [doi]
Abstract is missing.