On-chip measurement to analyze failure mechanisms of ICs under system level ESD stress - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Fabrice Caignet, Nicolas Nolhier, M. Bafleur, A. Wang, Nicolas Mauran. On-chip measurement to analyze failure mechanisms of ICs under system level ESD stress. Microelectronics Reliability, 53(9-11):1278-1283, 2013. [doi]

This author has not been identified. Look up 'Fabrice Caignet' in GoogleThis author has not been identified. Look up 'Nicolas Nolhier' in GoogleThis author has not been identified. Look up 'M. Bafleur' in GoogleThis author has not been identified. Look up 'A. Wang' in GoogleThis author has not been identified. Look up 'Nicolas Mauran' in Google

runs on WebDSL