Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Fabrice Caignet, Nicolas Nolhier, M. Bafleur, A. Wang, Nicolas Mauran. On-chip measurement to analyze failure mechanisms of ICs under system level ESD stress. Microelectronics Reliability, 53(9-11):1278-1283, 2013. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: 20 GHz on-chip measurement of ESD waveform for system level analysisFabrice Caignet, Nicolas Nolhier, Marise Bafleur, A. Wang, Nicolas Mauran. mr, 55(11):2276-2283, 2015. [doi]
The following publications are possibly variants of this publication: