20 GHz on-chip measurement of ESD waveform for system level analysis

Fabrice Caignet, Nicolas Nolhier, Marise Bafleur, A. Wang, Nicolas Mauran. 20 GHz on-chip measurement of ESD waveform for system level analysis. Microelectronics Reliability, 55(11):2276-2283, 2015. [doi]

Abstract

Abstract is missing.