20 GHz on-chip measurement of ESD waveform for system level analysis

Fabrice Caignet, Nicolas Nolhier, Marise Bafleur, A. Wang, Nicolas Mauran. 20 GHz on-chip measurement of ESD waveform for system level analysis. Microelectronics Reliability, 55(11):2276-2283, 2015. [doi]

Authors

Fabrice Caignet

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Nicolas Nolhier

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Marise Bafleur

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A. Wang

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Nicolas Mauran

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