Fabrice Caignet, Nicolas Nolhier, Marise Bafleur, A. Wang, Nicolas Mauran. 20 GHz on-chip measurement of ESD waveform for system level analysis. Microelectronics Reliability, 55(11):2276-2283, 2015. [doi]
@article{CaignetNBWM15,
title = {20 GHz on-chip measurement of ESD waveform for system level analysis},
author = {Fabrice Caignet and Nicolas Nolhier and Marise Bafleur and A. Wang and Nicolas Mauran},
year = {2015},
doi = {10.1016/j.microrel.2014.12.021},
url = {http://dx.doi.org/10.1016/j.microrel.2014.12.021},
researchr = {https://researchr.org/publication/CaignetNBWM15},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {55},
number = {11},
pages = {2276-2283},
}