Nicola Campregher, Peter Y. K. Cheung, George A. Constantinides, Milan Vasilko. Analysis of yield loss due to random photolithographic defects in the interconnect structure of FPGAs. In Herman Schmit, Steven J. E. Wilton, editors, Proceedings of the ACM/SIGDA 13th International Symposium on Field Programmable Gate Arrays, FPGA 2005, Monterey, California, USA, February 20-22, 2005. pages 138-148, ACM, 2005. [doi]
Abstract is missing.