Bei Cao, Zhiyuan Li, Dianzhong Wen. Generation of low power testing based on novel SIC sequences. In 2015 IEEE 11th International Conference on ASIC, ASICON 2015, Chengdu, China, November 3-6, 2015. pages 1-4, IEEE, 2015. [doi]
@inproceedings{CaoLW15,
title = {Generation of low power testing based on novel SIC sequences},
author = {Bei Cao and Zhiyuan Li and Dianzhong Wen},
year = {2015},
doi = {10.1109/ASICON.2015.7517200},
url = {https://doi.org/10.1109/ASICON.2015.7517200},
researchr = {https://researchr.org/publication/CaoLW15},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {2015 IEEE 11th International Conference on ASIC, ASICON 2015, Chengdu, China, November 3-6, 2015},
publisher = {IEEE},
isbn = {978-1-4799-8485-5},
}