Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Bei Cao, Zhiyuan Li, Dianzhong Wen. Generation of low power testing based on novel SIC sequences. In 2015 IEEE 11th International Conference on ASIC, ASICON 2015, Chengdu, China, November 3-6, 2015. pages 1-4, IEEE, 2015. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: On Low-Capture-Power Test Generation for Scan TestingXiaoqing Wen, Yoshiyuki Yamashita, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita. vts 2005: 265-270 [doi]
The following publications are possibly variants of this publication: