Generation of low power testing based on novel SIC sequences

Bei Cao, Zhiyuan Li, Dianzhong Wen. Generation of low power testing based on novel SIC sequences. In 2015 IEEE 11th International Conference on ASIC, ASICON 2015, Chengdu, China, November 3-6, 2015. pages 1-4, IEEE, 2015. [doi]

Abstract

Abstract is missing.