An Approach to Detect Negative Bias Temperature Instability (NBTI) in Ultra-Deep Submicron Technologies - researchr publication authors

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Ronald Carlsten, Jeremy Ralston-Good, Douglas Goodman. An Approach to Detect Negative Bias Temperature Instability (NBTI) in Ultra-Deep Submicron Technologies. In International Symposium on Circuits and Systems (ISCAS 2007), 27-20 May 2007, New Orleans, Louisiana, USA. pages 1257-1260, IEEE, 2007. [doi]

This author has not been identified. Look up 'Ronald Carlsten' in GoogleThis author has not been identified. Look up 'Jeremy Ralston-Good' in GoogleThis author has not been identified. Look up 'Douglas Goodman' in Google

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