Ronald Carlsten, Jeremy Ralston-Good, Douglas Goodman. An Approach to Detect Negative Bias Temperature Instability (NBTI) in Ultra-Deep Submicron Technologies. In International Symposium on Circuits and Systems (ISCAS 2007), 27-20 May 2007, New Orleans, Louisiana, USA. pages 1257-1260, IEEE, 2007. [doi]
@inproceedings{CarlstenRG07,
title = {An Approach to Detect Negative Bias Temperature Instability (NBTI) in Ultra-Deep Submicron Technologies},
author = {Ronald Carlsten and Jeremy Ralston-Good and Douglas Goodman},
year = {2007},
doi = {10.1109/ISCAS.2007.378339},
url = {http://doi.ieeecomputersociety.org/10.1109/ISCAS.2007.378339},
tags = {systematic-approach},
researchr = {https://researchr.org/publication/CarlstenRG07},
cites = {0},
citedby = {0},
pages = {1257-1260},
booktitle = {International Symposium on Circuits and Systems (ISCAS 2007), 27-20 May 2007, New Orleans, Louisiana, USA},
publisher = {IEEE},
}