Ronald Carlsten, Jeremy Ralston-Good, Douglas Goodman. An Approach to Detect Negative Bias Temperature Instability (NBTI) in Ultra-Deep Submicron Technologies. In International Symposium on Circuits and Systems (ISCAS 2007), 27-20 May 2007, New Orleans, Louisiana, USA. pages 1257-1260, IEEE, 2007. [doi]
Abstract is missing.