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Early Reliability Estimation in Hardware Accelerators using Improved Colored Petri Nets

Ernesto Cristopher Villegas Castillo, Felipe Augusto da Silva, Josie E. Rodriguez Condia, Juan-David Guerrero-Balaguera, Michael Glaß. Early Reliability Estimation in Hardware Accelerators using Improved Colored Petri Nets. In IEEE International Test Conference, ITC 2025, San Diego, CA, USA, September 20-26, 2025. pages 498-501, IEEE, 2025. [doi]

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Ernesto Cristopher Villegas Castillo

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Felipe Augusto da Silva

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Josie E. Rodriguez Condia

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Juan-David Guerrero-Balaguera

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Michael Glaß

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