Ernesto Cristopher Villegas Castillo, Felipe Augusto da Silva, Josie E. Rodriguez Condia, Juan-David Guerrero-Balaguera, Michael Glaß. Early Reliability Estimation in Hardware Accelerators using Improved Colored Petri Nets. In IEEE International Test Conference, ITC 2025, San Diego, CA, USA, September 20-26, 2025. pages 498-501, IEEE, 2025. [doi]
@inproceedings{CastilloSCGG25,
title = {Early Reliability Estimation in Hardware Accelerators using Improved Colored Petri Nets},
author = {Ernesto Cristopher Villegas Castillo and Felipe Augusto da Silva and Josie E. Rodriguez Condia and Juan-David Guerrero-Balaguera and Michael Glaß},
year = {2025},
doi = {10.1109/ITC58126.2025.00074},
url = {https://doi.org/10.1109/ITC58126.2025.00074},
researchr = {https://researchr.org/publication/CastilloSCGG25},
cites = {0},
citedby = {0},
pages = {498-501},
booktitle = {IEEE International Test Conference, ITC 2025, San Diego, CA, USA, September 20-26, 2025},
publisher = {IEEE},
isbn = {979-8-3315-7041-5},
}