Ernesto Cristopher Villegas Castillo, Felipe Augusto da Silva, Josie E. Rodriguez Condia, Juan-David Guerrero-Balaguera, Michael Glaß. Early Reliability Estimation in Hardware Accelerators using Improved Colored Petri Nets. In IEEE International Test Conference, ITC 2025, San Diego, CA, USA, September 20-26, 2025. pages 498-501, IEEE, 2025. [doi]
Abstract is missing.