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An electromigration and thermal model of power wires for a priori high-level reliability prediction

Mario R. Casu, Mariagrazia Graziano, Guido Masera, Gianluca Piccinini, Maurizio Zamboni. An electromigration and thermal model of power wires for a priori high-level reliability prediction. IEEE Trans. VLSI Syst., 12(4):349-358, 2004.

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