Ondrej Cekan, Jakub Podivinsky, Jakub Lojda, Richard Panek, Martin Krcma, Zdenek Kotásek. Testing Reliability of Smart Electronic Locks: Analysis and the First Steps Towards. In 22nd Euromicro Conference on Digital System Design, DSD 2019, Kallithea, Greece, August 28-30, 2019. pages 506-513, IEEE, 2019. [doi]
Abstract is missing.