Soonyoung Cha, Chang-Chih Chen, Taizhi Liu, Linda S. Milor. Extraction of threshold voltage degradation modeling due to Negative Bias Temperature Instability in circuits with I/O measurements. In IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014. pages 1-6, IEEE, 2014. [doi]
Abstract is missing.