Negative Bias Temperature Instability and Gate Oxide Breakdown Modeling in Circuits With Die-to-Die Calibration Through Power Supply and Ground Signal Measurements - researchr publication

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Soonyoung Cha, Taizhi Liu, Linda Milor. Negative Bias Temperature Instability and Gate Oxide Breakdown Modeling in Circuits With Die-to-Die Calibration Through Power Supply and Ground Signal Measurements. IEEE Trans. VLSI Syst., 25(8):2271-2284, 2017. [doi]

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