Tapan J. Chakraborty, Chen-Huan Chiang, Bradford G. Van Treuren. A practical approach to comprehensive system test & debug using boundary scan based test architecture. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-10, IEEE, 2007. [doi]
Abstract is missing.