SmartScan - Hierarchical test compression for pin-limited low power designs - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Krishna Chakravadhanula, Vivek Chickermane, D. Pearl, A. Garg, R. Khurana, S. Mukherjee, P. Nagaraj. SmartScan - Hierarchical test compression for pin-limited low power designs. In 2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013. pages 1-9, IEEE Computer Society, 2013. [doi]

This author has not been identified. Look up 'Krishna Chakravadhanula' in GoogleThis author has not been identified. Look up 'Vivek Chickermane' in GoogleThis author has not been identified. Look up 'D. Pearl' in GoogleThis author has not been identified. Look up 'A. Garg' in GoogleThis author has not been identified. Look up 'R. Khurana' in GoogleThis author has not been identified. Look up 'S. Mukherjee' in GoogleThis author has not been identified. Look up 'P. Nagaraj' in Google

runs on WebDSL