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Internal I/O Testing: Definition and a Solution

Sreejit Chakravarty, Fei Su, Indira A. Gohad, Sudheer V. Bandana, B. S. Adithya, Wei Ming Lim. Internal I/O Testing: Definition and a Solution. In 38th IEEE VLSI Test Symposium, VTS 2020, San Diego, CA, USA, April 5-8, 2020. pages 1-6, IEEE, 2020. [doi]

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Sreejit Chakravarty

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Fei Su

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Indira A. Gohad

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Sudheer V. Bandana

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B. S. Adithya

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Wei Ming Lim

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