Internal I/O Testing: Definition and a Solution

Sreejit Chakravarty, Fei Su, Indira A. Gohad, Sudheer V. Bandana, B. S. Adithya, Wei Ming Lim. Internal I/O Testing: Definition and a Solution. In 38th IEEE VLSI Test Symposium, VTS 2020, San Diego, CA, USA, April 5-8, 2020. pages 1-6, IEEE, 2020. [doi]

Abstract

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