Sreejit Chakravarty, Fei Su, Indira A. Gohad, Sudheer V. Bandana, B. S. Adithya, Wei Ming Lim. Internal I/O Testing: Definition and a Solution. In 38th IEEE VLSI Test Symposium, VTS 2020, San Diego, CA, USA, April 5-8, 2020. pages 1-6, IEEE, 2020. [doi]
@inproceedings{ChakravartySGBA20,
title = {Internal I/O Testing: Definition and a Solution},
author = {Sreejit Chakravarty and Fei Su and Indira A. Gohad and Sudheer V. Bandana and B. S. Adithya and Wei Ming Lim},
year = {2020},
doi = {10.1109/VTS48691.2020.9107567},
url = {https://doi.org/10.1109/VTS48691.2020.9107567},
researchr = {https://researchr.org/publication/ChakravartySGBA20},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {38th IEEE VLSI Test Symposium, VTS 2020, San Diego, CA, USA, April 5-8, 2020},
publisher = {IEEE},
isbn = {978-1-7281-5359-9},
}