Testing of resistive opens in CMOS latches and flip-flops

Víctor H. Champac, Antonio Zenteno, José L. Garcia. Testing of resistive opens in CMOS latches and flip-flops. In 10th European Test Symposium (ETS 2005), May 22-25, 2005, Tallinn, Estonia. pages 34-40, IEEE, 2005. [doi]

Abstract

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