Antonio H. Chan, Gordon W. Roberts. A deep sub-micron timing measurement circuit using a single-stage Vernier delay line. In Proceedings of the IEEE 2002 Custom Integrated Circuits Conference, CICC 2002, Orlando, FL, USA, May 12-15, 2002. pages 77-80, IEEE, 2002. [doi]
@inproceedings{ChanR02-0, title = {A deep sub-micron timing measurement circuit using a single-stage Vernier delay line}, author = {Antonio H. Chan and Gordon W. Roberts}, year = {2002}, doi = {10.1109/CICC.2002.1012770}, url = {https://doi.org/10.1109/CICC.2002.1012770}, researchr = {https://researchr.org/publication/ChanR02-0}, cites = {0}, citedby = {0}, pages = {77-80}, booktitle = {Proceedings of the IEEE 2002 Custom Integrated Circuits Conference, CICC 2002, Orlando, FL, USA, May 12-15, 2002}, publisher = {IEEE}, isbn = {0-7803-7250-6}, }