Anshuman Chandra, Krishnendu Chakrabarty. Frequency-Directed Run-Length (FDR) Codes with Application to System-on-a-Chip Test Data Compression. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 42-47, IEEE Computer Society, 2001. [doi]
Abstract is missing.