Anshuman Chandra, Moiz Khan, Ankita Patidar, Fumiaki Takashima, Sandeep Kumar Goel, Bharath Shankaranarayanan, Vuong Nguyen, Vistrita Tyagi, Manish Arora. A Case Study on IEEE 1838 Compliant Multi-Die 3DIC DFT Implementation. In IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023. pages 11-20, IEEE, 2023. [doi]
Abstract is missing.