Anshuman Chandra, Jyotirmoy Saikia, Rohit Kapur. Breaking the Test Application Time Barriers in Compression: Adaptive Scan-Cyclical (AS-C). In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 432-437, IEEE Computer Society, 2011. [doi]
Abstract is missing.