Compact Test Pattern Selection for Small Delay Defect - researchr publication authors

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Chia-Yuan Chang, Kuan-Yu Liao, Sheng-Chang Hsu, James Chien-Mo Li, Jiann-Chyi Rau. Compact Test Pattern Selection for Small Delay Defect. IEEE Trans. on CAD of Integrated Circuits and Systems, 32(6):971-975, 2013. [doi]

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