Chia-Yuan Chang, Kuan-Yu Liao, Sheng-Chang Hsu, James Chien-Mo Li, Jiann-Chyi Rau. Compact Test Pattern Selection for Small Delay Defect. IEEE Trans. on CAD of Integrated Circuits and Systems, 32(6):971-975, 2013. [doi]
@article{ChangLHLR13,
title = {Compact Test Pattern Selection for Small Delay Defect},
author = {Chia-Yuan Chang and Kuan-Yu Liao and Sheng-Chang Hsu and James Chien-Mo Li and Jiann-Chyi Rau},
year = {2013},
doi = {10.1109/TCAD.2013.2237946},
url = {http://dx.doi.org/10.1109/TCAD.2013.2237946},
researchr = {https://researchr.org/publication/ChangLHLR13},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {32},
number = {6},
pages = {971-975},
}