Compact Test Pattern Selection for Small Delay Defect

Chia-Yuan Chang, Kuan-Yu Liao, Sheng-Chang Hsu, James Chien-Mo Li, Jiann-Chyi Rau. Compact Test Pattern Selection for Small Delay Defect. IEEE Trans. on CAD of Integrated Circuits and Systems, 32(6):971-975, 2013. [doi]

Abstract

Abstract is missing.