Detecting Delay Flaws by Very-Low-Voltage Testing - researchr publication authors

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Jonathan T.-Y. Chang, Edward J. McCluskey. Detecting Delay Flaws by Very-Low-Voltage Testing. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 367-376, IEEE Computer Society, 1996.

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