Jonathan T.-Y. Chang, Edward J. McCluskey. Detecting Delay Flaws by Very-Low-Voltage Testing. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 367-376, IEEE Computer Society, 1996.
@inproceedings{ChangM96:2,
title = {Detecting Delay Flaws by Very-Low-Voltage Testing},
author = {Jonathan T.-Y. Chang and Edward J. McCluskey},
year = {1996},
tags = {testing},
researchr = {https://researchr.org/publication/ChangM96%3A2},
cites = {0},
citedby = {0},
pages = {367-376},
booktitle = {Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996},
publisher = {IEEE Computer Society},
isbn = {0-7803-3541-4},
}