Detecting resistive shorts for CMOS domino circuits

Jonathan T.-Y. Chang, Edward J. McCluskey. Detecting resistive shorts for CMOS domino circuits. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 890-899, IEEE Computer Society, 1998. [doi]

Authors

Jonathan T.-Y. Chang

This author has not been identified. Look up 'Jonathan T.-Y. Chang' in Google

Edward J. McCluskey

This author has not been identified. Look up 'Edward J. McCluskey' in Google