Jonathan T.-Y. Chang, Edward J. McCluskey. Detecting resistive shorts for CMOS domino circuits. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 890-899, IEEE Computer Society, 1998. [doi]
@inproceedings{ChangM98:0,
title = {Detecting resistive shorts for CMOS domino circuits},
author = {Jonathan T.-Y. Chang and Edward J. McCluskey},
year = {1998},
url = {http://www.computer.org/proceedings/itc/5093/50930890abs.htm},
researchr = {https://researchr.org/publication/ChangM98%3A0},
cites = {0},
citedby = {0},
pages = {890-899},
booktitle = {Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998},
publisher = {IEEE Computer Society},
isbn = {0-7803-5093-6},
}