Test Methodology for Defect-Based Bridge Faults

Shuo-Wen Chang, Yu-Teng Nien, Yu-Pang Hu, Kai-Chiang Wu, Chi-Chun Wang, Fu-Sheng Huang, Yi-Lun Tang, Yung-Chen Chen, Ming-Chien Chen, Mango C.-T. Chao. Test Methodology for Defect-Based Bridge Faults. IEEE Trans. VLSI Syst., 30(7):975-988, 2022. [doi]

Authors

Shuo-Wen Chang

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Yu-Teng Nien

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Yu-Pang Hu

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Kai-Chiang Wu

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Chi-Chun Wang

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Fu-Sheng Huang

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Yi-Lun Tang

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Yung-Chen Chen

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Ming-Chien Chen

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Mango C.-T. Chao

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