Shuo-Wen Chang, Yu-Teng Nien, Yu-Pang Hu, Kai-Chiang Wu, Chi-Chun Wang, Fu-Sheng Huang, Yi-Lun Tang, Yung-Chen Chen, Ming-Chien Chen, Mango C.-T. Chao. Test Methodology for Defect-Based Bridge Faults. IEEE Trans. VLSI Syst., 30(7):975-988, 2022. [doi]
@article{ChangNHWWHTCCC22,
title = {Test Methodology for Defect-Based Bridge Faults},
author = {Shuo-Wen Chang and Yu-Teng Nien and Yu-Pang Hu and Kai-Chiang Wu and Chi-Chun Wang and Fu-Sheng Huang and Yi-Lun Tang and Yung-Chen Chen and Ming-Chien Chen and Mango C.-T. Chao},
year = {2022},
doi = {10.1109/TVLSI.2022.3154535},
url = {https://doi.org/10.1109/TVLSI.2022.3154535},
researchr = {https://researchr.org/publication/ChangNHWWHTCCC22},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {30},
number = {7},
pages = {975-988},
}