Test Methodology for Defect-Based Bridge Faults

Shuo-Wen Chang, Yu-Teng Nien, Yu-Pang Hu, Kai-Chiang Wu, Chi-Chun Wang, Fu-Sheng Huang, Yi-Lun Tang, Yung-Chen Chen, Ming-Chien Chen, Mango C.-T. Chao. Test Methodology for Defect-Based Bridge Faults. IEEE Trans. VLSI Syst., 30(7):975-988, 2022. [doi]

Abstract

Abstract is missing.