Experimental Results for IDDQ and VLV Testing - researchr publication authors

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Jonathan T.-Y. Chang, Chao-Wen Tseng, Yi-Chin Chu, Sanjay Wattal, Mike Purtell, Edward J. McCluskey. Experimental Results for IDDQ and VLV Testing. In 16th IEEE VLSI Test Symposium (VTS 98), 28 April - 1 May 1998, Princeton, NJ, USA. pages 118-125, IEEE Computer Society, 1998. [doi]

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