Jonathan T.-Y. Chang, Chao-Wen Tseng, Yi-Chin Chu, Sanjay Wattal, Mike Purtell, Edward J. McCluskey. Experimental Results for IDDQ and VLV Testing. In 16th IEEE VLSI Test Symposium (VTS 98), 28 April - 1 May 1998, Princeton, NJ, USA. pages 118-125, IEEE Computer Society, 1998. [doi]
Abstract is missing.