Jonathan T.-Y. Chang, Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey. Analysis of pattern-dependent and timing-dependent failures in an experimental test chip. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 184-193, IEEE Computer Society, 1998. [doi]
Abstract is missing.