Defect Avoidance in a 3-D Heterogeneous Sensor - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Glenn H. Chapman, Vijay K. Jain, Shekhar Bhansali. Defect Avoidance in a 3-D Heterogeneous Sensor. In 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings. pages 67-75, IEEE Computer Society, 2004. [doi]

This author has not been identified. Look up 'Glenn H. Chapman' in GoogleThis author has not been identified. Look up 'Vijay K. Jain' in GoogleThis author has not been identified. Look up 'Shekhar Bhansali' in Google

runs on WebDSL