Glenn H. Chapman, Vijay K. Jain, Shekhar Bhansali. Defect Avoidance in a 3-D Heterogeneous Sensor. In 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings. pages 67-75, IEEE Computer Society, 2004. [doi]
Abstract is missing.