Glenn H. Chapman, Vijay K. Jain, Shekhar Bhansali. Defect Avoidance in a 3-D Heterogeneous Sensor. In 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings. pages 67-75, IEEE Computer Society, 2004. [doi]
@inproceedings{ChapmanJB04,
title = {Defect Avoidance in a 3-D Heterogeneous Sensor},
author = {Glenn H. Chapman and Vijay K. Jain and Shekhar Bhansali},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/dft/2004/2241/00/22410067abs.htm},
researchr = {https://researchr.org/publication/ChapmanJB04},
cites = {0},
citedby = {0},
pages = {67-75},
booktitle = {19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-7695-2241-6},
}