The following publications are possibly variants of this publication:
- Empirical formula for rates of hot pixel defects based on pixel size, sensor area, and ISOGlenn H. Chapman, Rohit Thomas, Zahava Koren, Israel Koren. ei-iss 2013: [doi]
- Projecting the rate of in-field pixel defects based on pixel size, sensor area, and ISOGlenn H. Chapman, Jenny Leung, Rohit Thomas, Ana I. L. Namburete, Zahava Koren, Israel Koren. ei-iss 2012: [doi]
- Predicting Pixel Defect Rates Based on Image Sensor ParametersGlenn H. Chapman, Jenny Leung, Ana Namburete, Israel Koren, Zahava Koren. dft 2011: 408-416 [doi]
- Tradeoffs in Imager Design with Respect to Pixel Defect RatesGlenn H. Chapman, Jenny Leung, Israel Koren, Zahava Koren. dft 2010: 231-239 [doi]