Detecting SEUs in Noisy Digital Imagers with small pixels - researchr publication related

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Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Bifei Huang, Hao Yang, Israel Koren, Zahava Koren. Detecting SEUs in Noisy Digital Imagers with small pixels. In 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019. pages 1-6, IEEE, 2019. [doi]

The following publications are possibly variants of this publication:

Dependence of SEUs in Digital Cameras on Pixel size and ElevationGlenn H. Chapman, Simone Neufeld, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren, Coelho Silva Meneses. dft 2021: 1-4 [doi]

Exploring soft errors (SEUs) with digital imager pixels ranging from 7 to 1.3 μmGlenn H. Chapman, Parham Purbakht, Peter Le, Israel Koren, Zahava Koren. dft 2017: 1-4 [doi]

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